Industrial CT & Optical Scanning
Leveraging X-Ray Computed Tomography and structured light for internal defect detection and pointcloud surface generation.
Beyond the Surface
A tactile probe cannot measure what it cannot reach. For intricate micro-geometries, additive manufacturing (3D printing), and internal porosity analysis, high-resolution continuous non-destructive methodologies are mandatory.
Our ZEISS METROTOM systems utilize high-energy industrial X-rays to generate true 3D volumetric models (voxels) of your encapsulated components. We combine this internal capability with ultra-dense optical structured-light fringe projection to rapidly capture thousands of external data points per shot. This dual approach delivers a complete, high-fidelity digital twin of the actual manufactured part.
By eliminating the need for destructive sectioning (like bandsawing), our engineers provide rapid turnaround on complex assemblies, allowing you to instantly visualize hidden defects and correct manufacturing processes before they lead to catastrophic failure.
- • Nominal-to-Actual Compare: Overlay high-density CT/Optical scan data directly onto the theoretical CAD model for instant volumetric color-map deviation analysis.
- • Porosity & Inclusion Defect: Quantify the exact void volume percentage and spatial location of trapped gas inside cast aluminum and composite components.
- • Wall Thickness Analysis: Evaluate completely internal cross-sections and conformal cooling channels without physical disassembly.
VOXEL_GRID_RECONSTRUCTION
Core Inspection Platforms
ZEISS METROTOM
1500 / 800 CT Scanning Modules
ZEISS O-INSPECT
Multi-sensor optical tactile combination
Volume Graphics
VGSTUDIO MAX pointcloud rendering
GOM Inspect
ATOS Structured Blue Light Systems